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12 mm Coating Thickness Gauge For Non Conductive Coating Layers With Separate Probe

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12 mm Coating Thickness Gauge For Non Conductive Coating Layers With Separate Probe

Name: 12 mm Coating Thickness Gauge For Non Conductive Coating Layers With Separate Probe
Brand: HUATEC
Price: 1 USD

Wholesale 12 mm Coating Thickness Gauge For Non Conductive Coating Layers With Separate Probe from china suppliers

Brand Name : HUATEC

Model Number : TG-8829F

Certification : CE

Place of Origin : China

MOQ : 1 set

Payment Terms : TT, Western Union

Supply Ability : 500 pcs per month

Delivery Time : 3-7 working days

Packaging Details : Carton

Operating principle : magnetic induction

Measuring range : 0-12000um

Resolution : 0.1/1mm

Min. measuring area : 30mm

Min. sample thickness : 0.3mm

Power supply : 4x1.5V AAA(UM-4)battery

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12 mm Coating Thickness Gauge TG8829F For Non Conductive Coating Layers With Separate Probe

Description:

With separate probe(s)
Function: TG-8829F (ferrous substrate)

Operating principle: magnetic induction

Measuring range:0-12000um/

Resolution; 0.1/1

Accuracy: ±1-3%n or ±2.5um

Min. measuring area: 30mm

Min. sample thickness: 0.3mm

Battery indicator: low battery indicator

Metric/ imperial: convertible

Power supply: 4x1.5V AAA(UM-4)battery

Auto power off

Operating conditions:0-+45℃(32℉-104℉), ≤90%RH

Dimensions: 126x65x27mm

weight: 81g(not including battery)
Optional accessories: other range 0-200um to 15000um

Application:
TG-8829F can measure the thickness of non-magnetic coating layers (aluminum, chrome, copper, ename1, rubber, paint) on magnetic substrate (steel, iron, alloy and magnetic stainless steel)

Standard Delivery of TG8829F:
Main unit(1250um) 1
F type probe 1
F calibration base set 1
Calibration foil set 1set (4 foils)
Carrying case 1
Instruction manual 1

Optional Accessories
Cable and software for RS-232C

Customized testing range

Product Tags:

coating thickness measurement

coating thickness meter

12 mm Coating Thickness Gauge For Non Conductive Coating Layers With Separate Probe Images

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